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Chinese Optics Letters, Volume. 6, Issue 10, 773(2008)

Enhanced laser induced damage threshold of dielectric antireflection coatings by the introduction of one interfacial layer

Congjuan Wang1、*, Zhaoxia Han2, Yunxia Jin1, Jianda Shao1, and Zhengxiu Fan1
Author Affiliations
  • 1R and D Center of Optical Thin Film Coatings, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
  • 2School of Science, Henan University of Science and Technology, Luoyang 471003
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    CLP Journals

    [1] Liang Zhang, Farina K?nig, Joerg Neuhaus, Dominik Bauer, Thomas Dekorsy, Yafu Chen, "Dielectric coatings for optimized low-loss saturable absorbers for high-power ultrafast laser," Chin. Opt. Lett. 7, 819 (2009)

    [2] Ma Ping, Chen Songlin, Pan Feng, Wang Zhen, Luo Jin, Wu Qian, Shao Jianda. Laser-Induced Damage Performance of Sc2O3/SiO2 High-Reflection Coatings at 355 nm[J]. Acta Optica Sinica, 2009, 29(6): 1729

    [3] Chunxian Tao, Yuanan Zhao, Hongbo He, Dawei Li, Jianda Shao, Zhengxiu Fan, "Imaging photothermal microscopy for absorption measurements of optical coatings," Chin. Opt. Lett. 7, 1061 (2009)

    Cited By

    [1] Xufeng Jing, Jianda Shao, Yunxia Jin, Zhengxiu Fan. Near-field distribution of broadband antireflective nanostructure arrays. Optik, 123, 527(2012).

    [2] Aihuan Dun, Jingsong Wei, Fuxi Gan. Marangoni effect induced micro/nano-patterning on Sb2Te3 phase change thin film by laser pulse. Applied Physics A, 103, 139(2011).

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    Congjuan Wang, Zhaoxia Han, Yunxia Jin, Jianda Shao, Zhengxiu Fan, "Enhanced laser induced damage threshold of dielectric antireflection coatings by the introduction of one interfacial layer," Chin. Opt. Lett. 6, 773 (2008)

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    Paper Information

    Received: Mar. 21, 2008

    Accepted: --

    Published Online: Dec. 4, 2008

    The Author Email: Congjuan Wang (leeloocong@mail.siom.ac.cn)

    DOI:10.3788/COL20080610.0773

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology