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Semiconductor Optoelectronics, Volume. 46, Issue 3, 567(2025)

Dark Channel Dehazing Based on Multi-Scale Edge-Aware Filtering

CHENG Changchuan1, DAI Jinwei1, GUO Zhongyuan2, DAI Shaosheng1, and JIANG Dachuan3
Author Affiliations
  • 1School of Communications and Information Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, CHN
  • 2College of Electronic and Information Engineering, Southwest University, Chongqing 400715, CHN
  • 3National Institute of Measurement and Testing Technology, Chengdu 610021, CHN
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    CHENG Changchuan, DAI Jinwei, GUO Zhongyuan, DAI Shaosheng, JIANG Dachuan. Dark Channel Dehazing Based on Multi-Scale Edge-Aware Filtering[J]. Semiconductor Optoelectronics, 2025, 46(3): 567

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    Paper Information

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    Received: Mar. 31, 2025

    Accepted: Sep. 18, 2025

    Published Online: Sep. 18, 2025

    The Author Email:

    DOI:10.16818/j.issn1001-5868.20250331001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology