Fusion of attention and multi-level residuals for detection of surface defects in lead frame

NING Wenle; LI Zhiwei; XIAO Xinjie; DING Tingting; HUANG Runcai

doi:10.16136/j.joel.2025.04.0621

Journal of Optoelectronics · Laser, Volume. 36, Issue 4, 382(2025)

Fusion of attention and multi-level residuals for detection of surface defects in lead frame

NING Wenle¹, LI Zhiwei^1、*, XIAO Xinjie², DING Tingting¹, and HUANG Runcai¹

Author Affiliations

¹School of Electronic and Electrical Engineering, Shanghai University of Engineering Science, Shanghai 201620, China

²College of Information Science and Technology, Donghua University, Shanghai 201620, China

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NING Wenle, LI Zhiwei, XIAO Xinjie, DING Tingting, HUANG Runcai. Fusion of attention and multi-level residuals for detection of surface defects in lead frame[J]. Journal of Optoelectronics · Laser, 2025, 36(4): 382

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Paper Information

Received: Dec. 4, 2023

Accepted: Mar. 21, 2025

Published Online: Mar. 21, 2025

The Author Email: LI Zhiwei (zhiwei.li@sues.edu.cn)

DOI:10.16136/j.joel.2025.04.0621

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology