Laser & Optoelectronics Progress, Volume. 61, Issue 9, 0912001(2024)
Collimation Technique for Infrared Beam Based on Moire Fringe
[1] Liu S R, Xue B, Cheng Y et al. High-accuracy twist measurement based on the spherical wave Talbot effect for a bi-grid modulation collimator[J]. Applied Optics, 60, 6547-6553(2021).
[2] Wei J F, Wang H L, Du X et al. Imaging quality prediction and measurement for optical microlens array[J]. Acta Optica Sinica, 43, 0411001(2023).
[3] Wang Y, Zhai H C, Jutamulia S et al. Collimation test of a corrected laser diode beam using lateral shearing interferometer[J]. Optics Communications, 274, 412-416(2007).
[4] Liu W J, Gao Z S, Ma Y C et al. Measurement of large aperture collimated wavefront by pentaprism array scanning based on non-uniform sampling[J]. Chinese Journal of Lasers, 49, 2404001(2022).
[5] Liu Y Y, Cheng J. Two-dimensional Talbot effect in uniaxial crystals orthogonal to optical axis[J]. Acta Optica Sinica, 43, 0505001(2023).
[6] Zhang M L, Liu L R, Wan L Y et al. Method of CCD scan for collimation testing[J]. Acta Optica Sinica, 25, 1067-1071(2005).
[7] Huang L, Su X Y. Two methods in checking light beam collimation with double spiral Moiré fringes[J]. Acta Optica Sinica, 27, 609-615(2007).
[8] Cai S, Qiao Y F. The technology of autocollimation angle measurement based on Moiré fringe[J]. Journal of Test and Measurement Technology, 21, 519-522(2007).
[9] Yang X M, Zheng S C, Huang G K et al. Fourier transform of 2D Moiré fringe[J]. Laser & Optoelectronics Progress, 54, 092302(2017).
[10] Yu D Y, Tan H Y[M]. Engineering optics(2016).
[11] Chen Y, Yang K T. Research on the check of light collimation based on Talbot effect[J]. Optics & Optoelectronic Technology, 3, 37-40(2005).
[12] Cheng W H, Chen Y Y, Duan C S et al. Method of measuring grating constant based on Moiré measurement technology[J]. Laser & Optoelectronics Progress, 56, 062001(2019).
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Shangchen Cai, Qiluan Chen, Shu Zhang, Zuojun Tan. Collimation Technique for Infrared Beam Based on Moire Fringe[J]. Laser & Optoelectronics Progress, 2024, 61(9): 0912001
Category: Instrumentation, Measurement and Metrology
Received: Apr. 27, 2023
Accepted: Jun. 28, 2023
Published Online: Apr. 29, 2024
The Author Email: Zuojun Tan (tzj@mail.hzau.edu.cn)
CSTR:32186.14.LOP231187