Chinese Journal of Liquid Crystals and Displays, Volume. 35, Issue 2, 115(2020)

Research and improvement of bright dot caused by abnormal liquid crystal alignment on TFT-LCD

ZHOU Bo, WANG Qi, SONG Yong-zhi, HONG Young-tae, and CHEN Wei-tao
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    References(10)

    [1] [1] MA B P. Study and analysis of point defect in TFT-LCD process [D]. Suzhou: Soochow University, 2009. (in Chinese)

    [2] [2] HUANG Y W, CHEN Z L. Detection and repair of point defects in TFT LCD [J]. Modern Electronics Technique,2012, 35(23): 189-191. (in Chinese)

    [7] [7] PAN D M, WANG L X, CAI D D, et al. Application of some atomic force microscopic imaging mode in observation of polymer solar cells [J]. Polymer Bulletin, 2014(10): 92-97. (in Chinese)

    [8] [8] SUN L M. Applications of time-of-flight secondary ion mass spectrometry in biomaterials and life science (Part Ⅱ) [J]. Journal of Chinese Mass Spectrometry Society, 2014, 35(5): 385-396. (in Chinese)

    [9] [9] MA Q G. Principle and Design in TFT-LCD [M]. Beijing: Publishing House of Electronics Industry, 2011. (in Chinese)

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    ZHOU Bo, WANG Qi, SONG Yong-zhi, HONG Young-tae, CHEN Wei-tao. Research and improvement of bright dot caused by abnormal liquid crystal alignment on TFT-LCD[J]. Chinese Journal of Liquid Crystals and Displays, 2020, 35(2): 115

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    Paper Information

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    Received: Jun. 18, 2019

    Accepted: --

    Published Online: Mar. 26, 2020

    The Author Email:

    DOI:10.3788/yjyxs20203502.0115

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