[2] [2] Green R O. Applied Optics, 1998, 37(4): 683.

[3] [3] Ramon D, Santer R P, Dubuisson P. Proc. SPIE, 2003, 4891: 505.

[4] [4] Uchikata T, Tanaka K, Okamura Y, et al. 2014, 9264: 92640Q.

[5] [5] Xiong X, Chiang K, Esposito J, et al. Metrologia, 2003, 40(1): S89.

[6] [6] Neville R A, Sun L, Staenz K. Proc. SPIE, 2003, 5093: 144.

[7] [7] Barry P, Shepanski J, Segal C. Proc. SPIE, 2002, 4480: 231.

[8] [8] Gao B C, Montes M J, Davis C O. Remote Sensing of Environment, 2004, 90(4): 424.

[9] [9] Guanter L, Richter R, Moreno J. Applied Optics, 2006, 45(10): 2360.

[10] [10] Guanter L, Segl K, Sang B, et al. Optics Express, 2009, 17(14): 11594.

[12] [12] Wang Hongbo, Huang Xiaoxian, Ma Liang, et al. Proc. SPIE, 2014, 9261: 92611O.