Fig. 1. (a) Experimental setup for observing RWs. Inset: input profile. (b)–(d) Output beam profiles for indicated voltages.

Fig. 2. Statistical chart of RWs probability with indicated voltage in experiments.

Fig. 3. (a) Scintillation index of the exit surface at different voltages. (b) Statistical probability plot of Gaussian RWs versus voltage in numerical simulation. Inset: probability distribution of AI under 700 V.

Fig. 4. Statistical probability plot of plane RWs with voltage in numerical simulation. Inset: probability distribution of ratio of emitted light intensity to I_e under 600 V.

Fig. 5. Blue line shows the statistics of the maximum light intensity varying with voltage under GB. Red line shows the statistical graph of the wave number whose intensity is greater than I_e varies with voltage.

Fig. 6. (a)–(c) Light intensity distribution during GB propagation at different voltages. (d)–(f) Light intensity distribution during PB propagation at different voltages.

Fig. 7. (a)–(c) Output beam profiles for indicated voltages. (d)–(f) Spatial spectra of output beams.