Acta Optica Sinica, Volume. 42, Issue 14, 1412003(2022)

Optical Transfer Function Measurement Based on Macroscopic Fourier Ptychography

Dong Pu1,2,3, Xiaoliang He1,2,4, Yaping Ge1,2, Cheng Liu1,2, and Jianqiang Zhu1,2、*
Author Affiliations
  • 1Joint Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Joint Laboratory on High Power Laser and Physics, China Academy of Engineering Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 3Center of Materials Science and Optoelectronics Engineering,University of Chinese Academy of Sciences, Beijing 100049, China
  • 4School of Science, Jiangnan University, Wuxi 214122, Jiangsu , China
  • show less
    Figures & Tables(9)
    Flow chart of OTF computation based on macroscopic Fourier ptychography
    Schematic diagram for OTF measurement based on macroscopic Fourier ptychography
    Experimental setup for OTF measurement based on macroscopic Fourier ptychography
    Images captured in experiment and reconstruction results. (a) 9×9 images captured in experiment; (b) reconstructed high-resolution image
    Measurement results. (a) Amplitude of CTF; (b) phase of CTF; (c) MTF; (d) PTF
    Fringe Zernike polynomial coefficients
    Experimental data and measurement results. (a) Obstructed lens; (b) 3×3 images captured in experiment; (c) reconstructed high-resolution image; (d) reconstructed amplitude of pupil function; (e) reconstructed phase of pupil function; (f) MTF
    MTF measurement results under different overlap rates. (a) 74.4%; (b) 65.5%; (c) 56.7%
    Comparison among MTF results obtained by proposed method, theoretical values and instrument measurements
    Tools

    Get Citation

    Copy Citation Text

    Dong Pu, Xiaoliang He, Yaping Ge, Cheng Liu, Jianqiang Zhu. Optical Transfer Function Measurement Based on Macroscopic Fourier Ptychography[J]. Acta Optica Sinica, 2022, 42(14): 1412003

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 17, 2022

    Accepted: Feb. 21, 2022

    Published Online: Jul. 15, 2022

    The Author Email: Zhu Jianqiang (jqzhu@siom.ac.cn)

    DOI:10.3788/AOS202242.1412003

    Topics