High Resolution X-ray Spectral Diagnosis Based on Multi-Rowland-Circle Crystal

Jun Shi; Yue Jiang; Miao Li; Feng Wang; Guohong Yang; Minxi Wei; Ao Sun; Ruize Wang; Jixin Yang

doi:10.3788/AOS241562

Acta Optica Sinica, Volume. 45, Issue 4, 0434001(2025)

High Resolution X-ray Spectral Diagnosis Based on Multi-Rowland-Circle Crystal

Jun Shi¹, Yue Jiang¹, Miao Li^2、*, Feng Wang³, Guohong Yang³, Minxi Wei³, Ao Sun³, Ruize Wang¹, and Jixin Yang¹

¹Key Laboratory of Optoelectronic Technology & Systems, Ministry of Education, Chongqing University, Chongqing 400044, China

²College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China

³Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, Sichuan , China

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Jun Shi, Yue Jiang, Miao Li, Feng Wang, Guohong Yang, Minxi Wei, Ao Sun, Ruize Wang, Jixin Yang. High Resolution X-ray Spectral Diagnosis Based on Multi-Rowland-Circle Crystal[J]. Acta Optica Sinica, 2025, 45(4): 0434001

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Paper Information

Category: X-Ray Optics

Received: Sep. 18, 2024

Accepted: Dec. 10, 2024

Published Online: Feb. 20, 2025

The Author Email: Miao Li (limiao@cqupt.edu.cn)

DOI:10.3788/AOS241562

CSTR:32393.14.AOS241562

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology