[1] Balph T, O'Malley P. C modeling accelerates HDL-system design[J]. Electrical Design News: The Magazine of Electronics Industry, 43, 139-147(1998).

[2] Tressler J F, Alkoy S, Newnham R E. Piezoelectric sensors and sensor materials[J]. Journal of Electroceramics, 2, 257-272(1998).

[3] Smith G L, Pulskamp J S, Sanchez L M et al. PZT-based piezoelectric MEMS technology[J]. Journal of the American Ceramic Society, 95, 1777-1792(2012).

[4] Srour J R, Palko J W. Displacement damage effects in irradiated semiconductor devices[J]. IEEE Transactions on Nuclear Science, 60, 1740-1766(2013).

[5] Graham J T, Brennecka G L, Ferreira P et al. Neutron irradiation effects on domain wall mobility and reversibility in lead zirconate titanate thin films[J]. Journal of Applied Physics, 113, 124104(2013).

[6] Kulikov D V, Trushin Y V, Kharlamov V S et al. Computer simulation of ferroelectric property changes in PLZT ceramics under neutron irradiation[C], 4348, 264-269(2001).

[7] Bittner R, Humer K, Weber H W et al. Oxygen vacancy defects in antiferroelectric PbZrO3 thin film heterostructures after neutron irradiation[J]. Journal of Applied Physics, 96, 3239-3246(2004).

[8] Gkotsis P, Kilchytska V, Bhaskar U et al. Neutron and gamma radiation effects on MEMS structures[J]. Procedia Engineering, 25, 172-175(2011).

[9] Smith G L, Pulskamp J S, Sanchez L M et al. PZT-based piezoelectric MEMS technology[J]. Journal of the American Ceramic Society, 95, 1777-1792(2012).

[10] Hilczer B, Kulek J. Effect of neutron irradiation on the electrical conductivity and current-voltage characteristics of PXZ1-xTx)O3 solid solution[J]. Ferroelectrics, 18, 131-135(1978).

[11] Toacsan M, Popescu-Pogrion N, Chipara M[M]. Microstructural and dielectric properties of fast neutrons irradiated PZT-ceramics(1992).

[12] Henriques A, Graham J T, Landsberger S et al. Crystallographic changes in lead zirconate titanate due to neutron irradiation[J]. AIP Advances, 4, 117125(2014).

[13] Park C H, Chadi D J. Microscopic study of oxygen-vacancy defects in ferroelectric perovskites[J]. Physical Review B, 57, R13961-R13964(1998).

[14] Qiao Z X, Wang C Y, Zou Y J et al. Oxygen vacancy and pyroelectric polarization collaboratively enhancing PEC performance in BaTiO3 photoelectrodes[J]. Colloids and Surfaces A: Physicochemical and Engineering Aspects, 647, 129073(2022).

[15] Rinard P. Neutron interactions with matter[J]. Nuclear Engineering, 22, 339-340(1992).

[16] Sinclair A N, Chertov A M. Radiation endurance of piezoelectric ultrasonic transducers: a review[J]. Ultrasonics, 57, 1-10(2015).

[17] Gao J, Zheng L, Huang B. Total dose radiation effects of Pt/PZT/Pt ferroelectric capacitors fabricated by PLD method[J]. Semiconductorence & Technology, 14, 836-839(1999).

[18] Shi Q J, Ma Y, Li Y et al. Drastic reduction of leakage current in ferroelectric Bi3.15Nd0.85Ti3O12 films by ionizing radiation[J]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 269, 452-454(2011).

[19] Akkopru-Akgun B, Thorsten J M, Tsuji K et al. Leakage current characteristics and DC resistance degradation mechanisms in Nb doped PZT films[J]. Journal of Applied Physics, 129(2021).

[20] Kremer R E, Arikan M C, Abele J C et al. Transient photoconductivity measurements in semi-insulating GaAs. I. An analog approach[J]. Journal of Applied Physics, 62, 2424-2431(1987).

[21] Istratov A A. New correlation procedure for the improvement of resolution of deep level transient spectroscopy of semiconductors[J]. Journal of Applied Physics, 82, 2965-2968(1997).

[22] Kundzins K, Zauls V, Kundzins M et al. Neutron irradiation effects on sol-gel PZT thin films[J]. Ferroelectrics, 258, 285-290(2001).

[23] Moore R A, Benedetto J M, McGarrity J M et al. Neutron irradiation effects on PZT thin films for nonvolatile-memory applications[J]. IEEE Transactions on Nuclear Science, 38, 1078-1082(1991).

[24] Wang D Y, Umeya K. Depletion-layer dielectric properties of positive temperature coefficient of resistance Barium titanate[J]. Journal of the American Ceramic Society, 73, 1574-1581(1990).

[25] Olarinoye I O, Ogundare F O. Optical and microstructural properties of neutron irradiated RF- sputtered amorphous alumina thin films[J]. Optik, 134, 66-77(2017).

[26] Li Y S, Ma Y, Zhou Y C. Polarization loss and leakage current reduction in Au/Bi3.15Nd0.85Ti3O12/Pt capacitors induced by electron radiation[J]. Applied Physics Letters, 94, 042903(2009).