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Chinese Optics Letters, Volume. 7, Issue 9, 753(2009)

Measurements of aerosol distribution by an elastic-backscatter lidar in summer 2008 in Beijing

Zhenyi Chen, Wenqing Liu, Yujun Zhang, and Nanjing Zhao and Jun Ruan
Author Affiliations
  • Key Lab. of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, China
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    [1] [1] V. Simeonov, P. Ristori, M. Taslakov, T. Dinoev, L. T. Molina, M. J. Molina, and H. van den Bergh, Proc. SPIE 5984, 59840O (2005).

    [2] [2] D. Han, W. Liu, Y. Lu, Y. Zhang, and H. Yang, Acta Opt. Sin. (in Chinese) 27, 384 (2007).

    [3] [3] X. Cheng, S. Gong, F. Li, Y. Dai, J. Song, J. Wang, and F. Li, Chinese J. Lasers (in Chinese) 34, 406 (2007).

    [4] [4] J. D. Klett, Appl. Opt. 20, 211 (1981).

    [5] [5] A. Ansmann and D. M¨uller, “Lidar and atmospheric aerosol particles” in C. Weitkamp, (ed.) Lidar: Range Resolved Optical Remote Sensing of the Atmosphere (Springer, Berlin, 2005) pp.105-141.

    [6] [6] A. Ansmann, U. Wandinger, M. Riebesell, C. Weitkamp, and W. Michaelis, Appl. Opt. 31, 7113 (1992).

    [7] [7] A. J. Heymsfield and C. M. R. Platt, J. Atmos. Sci. 41, 846 (1984).

    [8] [8] A. Ansmann, M. Riebesell, and C. Weitkamp, Opt. Lett. 15, 746 (1990).

    [9] [9] G. Pappalardo, A. Amodeo, M. Pandolfi, U. Wandinger, A. Ansmann, J. B¨osenberg, V. Matthias, V. Amiridis, F. De Tomasi, M. Frioud, M. Iarlori, L. Komguem, A. Papayannis, F. Rocadenbosch, and X. Wang, Appl. Opt. 43, 5370 (2004).

    CLP Journals

    [1] Zongming Tao, Qingze Zhang, Ke′e Yuan, Decheng Wu, Kaifa Cao, Shunxing Hu, Huanling Hu, "Retrieving aerosol backscattering coefficient for short range lidar using parameter selection at reference point," Chin. Opt. Lett. 8, 732 (2010)

    [2] Junfeng He, Wenqing Liu, Yunjun Zhang, Ruifeng Kan, Zhenyi Chen, Jun Ruan, "Atomosphere boundary layer height determination and observation from ceilometer measurements over Hefei during the total solar on July 22, 2009 eclipse," Chin. Opt. Lett. 8, 439 (2010)

    [3] Mao Feiyue, Gong Wei, Li Jun, Zhang Jinye. Cloud Detection and Parameter Retrieval Based on Improved Differential Zero-Crossing Method for Mie Lidar[J]. Acta Optica Sinica, 2010, 30(11): 3097

    Cited By

    [1] Zongming Tao, Dong Liu, Xiaomin Ma, Bo Shi, Huihui Shan, Ming Zhao, Chenbo Xie, Yingjian Wang. Vertical distribution of near-ground aerosol backscattering coefficient measured by a CCD side-scattering lidar. Applied Physics B, 120, 631(2015).

    [2] Yidan Si, Shenshen Li, Liangfu Chen, Chao Yu, Zifeng Wang, Yang Wang, Hongmei Wang. Validation and Spatiotemporal Distribution of GEOS-5–Based Planetary Boundary Layer Height and Relative Humidity in China. Advances in Atmospheric Sciences, 35, 479(2018).

    [3] Jie Wang, Tianshu Zhang, Wenqing Liu, Jianguo Liu, Xueping Wan. Vertical Characteristics of Aerosols in Lower Troposphere during a Haze Episode in Hinterland of YRD. Light, Energy and the Environment 2018 (E2, FTS, HISE, SOLAR, SSL), ET3A.1(2018).

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    Zhenyi Chen, Wenqing Liu, Yujun Zhang, Nanjing Zhao and Jun Ruan, "Measurements of aerosol distribution by an elastic-backscatter lidar in summer 2008 in Beijing," Chin. Opt. Lett. 7, 753 (2009)

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    Paper Information

    Received: Nov. 14, 2008

    Accepted: --

    Published Online: Sep. 22, 2009

    The Author Email:

    DOI:10.3788/COL20090709.0753

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology