Researching | Preliminary Investigation of a Schwarzschild Microscopical System at 18.2 nm

Acta Optica Sinica, Volume. 16, Issue 4, 531(1996)

Preliminary Investigation of a Schwarzschild Microscopical System at 18.2 nm

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[1] Shenghao Chen, Xin Wang, Qiushi Huang, Shuang Ma, Zhanshan Wang, "13.5 nm Schwarzschild microscope with high magnification and high resolution," Chin. Opt. Lett. 15, 043401 (2017)

[2] LIU Dai-zhong, CHEN Qin-hao, XU Ren-fang, FAN Dian-yuan. Fiber Optics Applied to Beams Automatic Alignment System[J]. Chinese Journal of Lasers, 2004, 31(s1): 409

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Preliminary Investigation of a Schwarzschild Microscopical System at 18.2 nm[J]. Acta Optica Sinica, 1996, 16(4): 531

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Mar. 26, 1995

Accepted: --

Published Online: Dec. 4, 2006

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Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology