Laser & Optoelectronics Progress, Volume. 62, Issue 11, 1127007(2025)
Atomic Entanglement-Enhanced Quantum Metrology (Invited)
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Jiayi Chen, Xin Jia, Zhongxiao Xu, Heng Shen. Atomic Entanglement-Enhanced Quantum Metrology (Invited)[J]. Laser & Optoelectronics Progress, 2025, 62(11): 1127007
Category: Quantum Optics
Received: Mar. 18, 2025
Accepted: Mar. 26, 2025
Published Online: May. 26, 2025
The Author Email: Heng Shen (hengshen@sxu.edu.cn)
CSTR:32186.14.LOP250846