Opto-Electronic Advances, Volume. 2, Issue 8, 190003-1(2019)

Ionization behavior and dynamics of picosecond laser filamentation in sapphire

Amina1,2, Lingfei Ji1,2、*, Tianyang Yan1,2, and Rui Ma1,2
Author Affiliations
  • 1Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China
  • 2Key Laboratory of Trans-scale Laser Manufacturing Technology, Ministry of Education, Beijing 100124, China
  • show less
    Figures & Tables(5)
    Schematic diagram of the experimental setup.
    (a) Laser beam intensity profiles simulation for the energies 87 μJ, 93 μJ, 100 μJ and 107 μJ. (b) Simulation of the significant role avalanche plays after photoionization (PI) introduces "seed" electrons in sapphire when irradiated with different laser energies. (c) Full and PI electron densities as a function of laser energy.
    (a) Total photoionization, MPI and tunneling ionization rate as a function of laser intensity in sapphire. (b) Enlarge image where MPI and tunneling ionization rate overlap at a Keldysh parameter of about 1.5. (c) Keldysh parameter as a function of laser intensity in sapphire.
    (a) Effective bandgap and (b) number of photons required for MPI process as a function of laser intensity in sapphire.
    [in Chinese]
    Tools

    Get Citation

    Copy Citation Text

    Amina, Lingfei Ji, Tianyang Yan, Rui Ma. Ionization behavior and dynamics of picosecond laser filamentation in sapphire[J]. Opto-Electronic Advances, 2019, 2(8): 190003-1

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Original Article

    Received: Feb. 16, 2019

    Accepted: Mar. 2, 2019

    Published Online: Sep. 3, 2019

    The Author Email: Lingfei Ji (ncltji@bjut.edu.cn)

    DOI:10.29026/oea.2019.190003

    Topics