Chinese Journal of Lasers, Volume. 45, Issue 9, 902002(2018)
Bi3.95Er0.05Ti3O12 Thin Films Synthesized by Pulsed Laser Deposition Technique and Their Dielectric Properties at Room Temperature
Fig. 1. XRD patterns of BErT thin films prepared under different deposition oxygen pressures
Fig. 2. SEM images of BErT thin films prepared under different deposition oxygen pressures. (a) 1 Pa; (b) 3 Pa; (c) 5 Pa; (d) 7 Pa
Fig. 3. Sectional morphology of BErT thin films deposited under oxygen pressure of 3 Pa
Fig. 4. Dielectric constant and dielectric loss of BErT thin films versus deposition oxygen pressure
Fig. 5. Dielectric constant and dielectric loss of BErT thin films versus frequency
Fig. 6. Dielectric constant and dielectric loss of BErT thin films versus electric field intensity at 1 kHz
Fig. 7. Dielectric constant and dielectric loss of BErT thin films versus temperature at frequency of 1 kHz
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Liang Lirong, Wei Aixiang, Mo Zhong. Bi3.95Er0.05Ti3O12 Thin Films Synthesized by Pulsed Laser Deposition Technique and Their Dielectric Properties at Room Temperature[J]. Chinese Journal of Lasers, 2018, 45(9): 902002
Category: laser manufacturing
Received: Mar. 21, 2018
Accepted: --
Published Online: Sep. 8, 2018
The Author Email: Zhong Mo (mozhong86513@163.com)