Chinese Journal of Lasers, Volume. 45, Issue 9, 902002(2018)

Bi3.95Er0.05Ti3O12 Thin Films Synthesized by Pulsed Laser Deposition Technique and Their Dielectric Properties at Room Temperature

Liang Lirong, Wei Aixiang, and Mo Zhong*
Author Affiliations
  • [in Chinese]
  • show less
    Figures & Tables(8)
    XRD patterns of BErT thin films prepared under different deposition oxygen pressures
    SEM images of BErT thin films prepared under different deposition oxygen pressures. (a) 1 Pa; (b) 3 Pa; (c) 5 Pa; (d) 7 Pa
    Sectional morphology of BErT thin films deposited under oxygen pressure of 3 Pa
    Dielectric constant and dielectric loss of BErT thin films versus deposition oxygen pressure
    Dielectric constant and dielectric loss of BErT thin films versus frequency
    Dielectric constant and dielectric loss of BErT thin films versus electric field intensity at 1 kHz
    Dielectric constant and dielectric loss of BErT thin films versus temperature at frequency of 1 kHz
    Optical transmissivity of sample
    Tools

    Get Citation

    Copy Citation Text

    Liang Lirong, Wei Aixiang, Mo Zhong. Bi3.95Er0.05Ti3O12 Thin Films Synthesized by Pulsed Laser Deposition Technique and Their Dielectric Properties at Room Temperature[J]. Chinese Journal of Lasers, 2018, 45(9): 902002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: laser manufacturing

    Received: Mar. 21, 2018

    Accepted: --

    Published Online: Sep. 8, 2018

    The Author Email: Zhong Mo (mozhong86513@163.com)

    DOI:10.3788/CJL201845.0902002

    Topics