Laser & Optoelectronics Progress, Volume. 58, Issue 5, 0531001(2021)

Research on Film Thickness Uniformity of Electron Beam Evaporation Spherical Fixture System

Yonggang Pan1、*, Zheng Liu1, Ben Wang2, Sibao Zhang1, and Lü Chenrui1
Author Affiliations
  • 1Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an , Shaanxi 710119, China
  • 2Shanghai Mifeng Laser Technology Co., Ltd., Shanghai 200120, China
  • show less
    Cited By

    Article index updated: Mar. 15, 2025

    The article is cited by 3 article(s) CLP online library. (Some content might be in Chinese.)
    Tools

    Get Citation

    Copy Citation Text

    Yonggang Pan, Zheng Liu, Ben Wang, Sibao Zhang, Lü Chenrui. Research on Film Thickness Uniformity of Electron Beam Evaporation Spherical Fixture System[J]. Laser & Optoelectronics Progress, 2021, 58(5): 0531001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Thin Films

    Received: Jul. 7, 2020

    Accepted: Aug. 27, 2020

    Published Online: Apr. 19, 2021

    The Author Email: Pan Yonggang (pyg_optics@163.com)

    DOI:10.3788/LOP202158.0531001

    Topics