Thermal Shocka | Thermal Cycling Test Specifications |
Basic Grade (TC-1) |
±100°C (temperature ramp rate ≥1.67°C/min) |
Enhanced Grade (TC-2) |
±120°C (temperature ramp rate ≥2°C/min) |
Extreme Grade (TC-3) |
±150°C (temperature ramp rate ≥2.5°C/min) |
Test Period Specifications |
Basic Grade |
1000 cycles |
(3 months mission simulation) |
Enhanced Grade |
20,000–30,000 cycles |
(3–5 year mission simulation) |
Evaluation Criteria |
Structural Integrity |
No interlayer delamination or electrode detachment observed |
Photovoltaic Performance |
PCE degradation ≤15% from the initial value |
(measured under AM1.5G, 1-sun illumination) |
High-Energy Particle Radiation Resistanceb | Proton Irradiation Test Specifications |
Basic Grade (PI-1) |
0.1 MeV, |
2 MeV, |
(3-year mission simulation) |
Enhanced Grade (PI-2) |
0.1 MeV, |
2 MeV, |
(10-year mission simulation) |
Evaluation Criteria |
Photovoltaic Performance |
PCE degradation ≤15% (Basic Grade) |
PCE degradation ≤20% (Enhanced Grade) |
Dark current increase ≤30% |
Vibration Endurance | Vibration Resistance Test |
Launch Phase Simulation |
Broadband random vibration 5–2000 Hz |
Acceleration spectral density 10–20 g²/Hz |
Duration ≥3 minutes |
Triaxial loading |
On-orbit phase simulation |
High-frequency micro-vibration 10–1000 Hz |
Acceleration spectral density 0.1–5 g²/Hz |
Simulating deployment mechanism dynamic loads |
Duration ≥10 hours. |
Bending Test Specifications |
Bending radius 1 mm |
Cycle count 105 |
Evaluation Criteria |
Post-bending PCE degradation ≤8% |
No substrate cracking or electrode fracture |
Atomic Oxygen Erosion Resistance | Test Specification |
Flux 3 × 1020 atoms/cm² |
AO energy 5–8 eV |
Beam uniformity ≥95% |
Fully encapsulated devices |
(3-year mission simulation) |
Evaluation Criteria |
Mass loss rate ≤5% |
Transmittance attenuation at 850 nm wavelength ≤10% |
Short-circuit current (ISC) degradation ≤15% |
Moisture Resistancec | Humidity Test Specifications |
3 months storage under constant conditions of 45°C/95% RH in an environmental chamber |
Evaluation Criteria |
Water absorption rate of encapsulation layer ≤3% |
Increase in device series resistance ≤20% |
No visible mold spots or electrolyte leakage observed |
Specific Powerd | Definition |
The ratio of device output power to total mass (including encapsulation, substrate, and electrodes), used for product performance grading. |
Production Classification |
Grade A |
>2.5 W/g (efficiency: >25%) |
Grade B |
1.8–2.2 W/g (efficiency: 22%–24%) |
Grade C |
1.2–1.5 W/g (efficiency: 18%–20%) |
Outgassing Test | Outgassing Test Specifications |
The device was placed under a vacuum of 1 × 10−4 Pa at a temperature of 125°C (257°F) and operated for 24 hours. Afterwards, its total mass loss (TML) and collected volatile condensable materials (CVCMs) were tested. |
Evaluation Criteria |
TML ≤1% |
CVCM ≤0.1% |