Calibration of the Axis of the Turntable in 4-Axis Laser Measuring System and Registration of Multi-View

[in Chinese]; [in Chinese]; [in Chinese]

Chinese Journal of Lasers, Volume. 32, Issue 5, 659(2005)

[in Chinese]^*, [in Chinese], and [in Chinese]

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References(4)

[5] [5] P. J. Besl, N. D. McKay. A method for registration of 3-D shapes [J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1992, 14(2): 239～256

[6] [6] C. Dorai, Gang Wang, A. K. Jain. Registration and integration of multiple object views for 3D model construction [J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1998, 20(1): 83～89

[7] [7] S. J. Umeyama. Least-squares estimation of transformation parameters between two point patterns [J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1991, 13(4): 376～380

[8] [8] R. Bergevin, M. Soucy, H. Gagnon et al.. Towards a general multi-view registration technique[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1996, 18(5): 540～547

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[2] Chao Bi, Xue Hao, Mengchen Liu, Jianguo Fang. Study on calibration method of rotary axis based on vision measurement[J]. Infrared and Laser Engineering, 2020, 49(4): 0413004

[3] Chen Xinyu, Ma Zi, Chen Tianfei, Li Peng. Novel Calibration Method for Axes in Line Structured Light Vision Measurement System[J]. Chinese Journal of Lasers, 2012, 39(11): 1108014

[4] Wei Xinguo, Liu Tao, Liu Zhen. Three-Dimensional Measurement Data Registration Based on Planar Circle Target[J]. Acta Optica Sinica, 2013, 33(2): 215002

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[in Chinese], [in Chinese], [in Chinese]. Calibration of the Axis of the Turntable in 4-Axis Laser Measuring System and Registration of Multi-View[J]. Chinese Journal of Lasers, 2005, 32(5): 659

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Paper Information

Category: measurement and metrology

Received: Mar. 29, 2004

Accepted: --

Published Online: Jun. 1, 2006

The Author Email: (xuyongan@hotmail.com)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology