Optical performance of ultra-thin silver films under the attenuated total reflection mode

Ming ZHOU; Sheng ZHOU; Gang CHEN; Yaopeng LI; Dingquan LIU

doi:10.1007/s12200-016-0574-7

Frontiers of Optoelectronics, Volume. 9, Issue 4, 549(2016)

Optical performance of ultra-thin silver films under the attenuated total reflection mode

Ming ZHOU^1、*, Sheng ZHOU¹, Gang CHEN¹, Yaopeng LI¹, and Dingquan LIU^1,2

Author Affiliations

¹Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China

²School of Physical Science and Technology, ShanghaiTech University, Shanghai 200031, China

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Ming ZHOU, Sheng ZHOU, Gang CHEN, Yaopeng LI, Dingquan LIU. Optical performance of ultra-thin silver films under the attenuated total reflection mode[J]. Frontiers of Optoelectronics, 2016, 9(4): 549

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Paper Information

Category: RESEARCH ARTICLE

Received: Dec. 18, 2015

Accepted: Mar. 26, 2016

Published Online: Mar. 9, 2017

The Author Email: Ming ZHOU (zhouming@mail.sitp.ac.cn)

DOI:10.1007/s12200-016-0574-7

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology