High‑Precision Calibration of Optical Lattice Trap Depth for Ultracold Atoms

Wenxin Yang; Yunda Li; Fangde Liu; Feifan Zhao; Xinjiang Yao; Pengjun Wang; Lianghui Huang; Liangchao Chen; Wei Han; Zengming Meng

doi:10.3788/AOS241833

Acta Optica Sinica, Volume. 45, Issue 7, 0702001(2025)

High‑Precision Calibration of Optical Lattice Trap Depth for Ultracold Atoms

Wenxin Yang... Yunda Li, Fangde Liu, Feifan Zhao, Xinjiang Yao, Pengjun Wang, Lianghui Huang, Liangchao Chen, Wei Han and Zengming Meng* |Show fewer author(s)

Author Affiliations

State Key Laboratory of Quantum Optics Technologies and Devices, Institute of Opto-Electronics, Shanxi University, Taiyuan 030006, Shanxi, China

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Figures & Tables(7)

Fig. 1. Diagram of one-dimensional optical lattice device. The optical lattice is along the x direction, the probe light is along the z axis (the direction of gravity), and the crossed optical dipole trap is in the x-y plane

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$Evolution of probability distribution of the number of atoms in the n=0 diffraction order with time. (a) Probability distribution of the number of atoms with trap depth V0=49.8Er and detection voltage Vd=600 mV; (b) evolution of probability distribution of the number of atoms with pulse time and detection voltage when the fixed pulse area is 2400 μs⋅mV, and the dashed line represents the upper limit of high-efficiency transfer of atoms in the zero-momentum state$

Fig. 2. Evolution of probability distribution of the number of atoms in the $n = 0$ diffraction order with time. (a) Probability distribution of the number of atoms with trap depth $V_{0} = 49.8 E_{r}$ and detection voltage $V_{d} = 600 m V$ ; (b) evolution of probability distribution of the number of atoms with pulse time and detection voltage when the fixed pulse area is $2400 μ s \cdot m V$ , and the dashed line represents the upper limit of high-efficiency transfer of atoms in the zero-momentum state

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$Evolution of the number of atoms at the n=0,+1,+2 diffraction orders with time, where the scatter points represent the experimental data and the guiding lines represent the theoretical calculation. (a) Trap depth is 10.2Er; (b) trap depth is 19.7Er; (c) trap depth is 40.1Er; (d) trap depth is 50.3Er$

Fig. 3. Evolution of the number of atoms at the $n = 0$ , $+ 1$ , $+ 2$ diffraction orders with time, where the scatter points represent the experimental data and the guiding lines represent the theoretical calculation. (a) Trap depth is $10.2 E_{r}$ ; (b) trap depth is $19.7 E_{r}$ ; (c) trap depth is $40.1 E_{r}$ ; (d) trap depth is $50.3 E_{r}$

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$Proportion of the number of atoms in n=±1 diffraction orders in multiple-pulse KD diffraction$

Fig. 4. Proportion of the number of atoms in $n = \pm 1$ diffraction orders in multiple-pulse KD diffraction

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$Relationship between depth of lattice trap and modulation frequency, and experimental measurement results of parametric oscillation heating. (a) s→h energy band widths of one-dimensional optical lattice, where the solid arrow indicates s→d energy band transition frequency obtained by parametric oscillation heating; (b) variation in atomic number loss of n=0 diffraction order with modulation frequency of parametric oscillation heating$

Fig. 5. Relationship between depth of lattice trap and modulation frequency, and experimental measurement results of parametric oscillation heating. (a) s→h energy band widths of one-dimensional optical lattice, where the solid arrow indicates s→d energy band transition frequency obtained by parametric oscillation heating; (b) variation in atomic number loss of $n = 0$ diffraction order with modulation frequency of parametric oscillation heating

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$Trap depth calibration results and linear fitting results of RN diffraction, single-pulse KD diffraction, multiple-pulse KD diffraction, and parametric oscillation heating methods$

Fig. 6. Trap depth calibration results and linear fitting results of RN diffraction, single-pulse KD diffraction, multiple-pulse KD diffraction, and parametric oscillation heating methods

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Table 1. Time of optical lattice pulse sequence, trap depth, and proportion of the number of atoms in $n = \pm 1$ diffraction orders
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Table 1. Time of optical lattice pulse sequence, trap depth, and proportion of the number of atoms in $n = \pm 1$ diffraction orders
$V_{0} / E_{r}$ $t_{1} / μ s$ $t_{2} / μ s$ $t_{3} / μ s$ $\frac{N_{1}}{N} / %$
9.04 52.617 29.777 28.840 99.99964
11.08 26.002 11.504 54.261 99.98054
19.48 24.561 40.180 55.917 99.97501
24.88 25.206 27.916 32.819 99.75577

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Wenxin Yang, Yunda Li, Fangde Liu, Feifan Zhao, Xinjiang Yao, Pengjun Wang, Lianghui Huang, Liangchao Chen, Wei Han, Zengming Meng. High‑Precision Calibration of Optical Lattice Trap Depth for Ultracold Atoms[J]. Acta Optica Sinica, 2025, 45(7): 0702001

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Paper Information

Category: Atomic and Molecular Physics

Received: Dec. 5, 2024

Accepted: Feb. 10, 2025

Published Online: Apr. 27, 2025

The Author Email: Meng Zengming (zmmeng01@sxu.edu.cn)

DOI:10.3788/AOS241833

CSTR:32393.14.AOS241833

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

Table 1. Time of optical lattice pulse sequence, trap depth, and proportion of the number of atoms in n=±1 diffraction orders

Table 1. Time of optical lattice pulse sequence, trap depth, and proportion of the number of atoms in n=±1 diffraction orders

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Table 1. Time of optical lattice pulse sequence, trap depth, and proportion of the number of atoms in $n = \pm 1$ diffraction orders

Table 1. Time of optical lattice pulse sequence, trap depth, and proportion of the number of atoms in $n = \pm 1$ diffraction orders