Surpassing the standard quantum limit of optical imaging via deep learning

Miao Cai; Zhi-Xiang Li; Hao-Dong Wu; Ya-Ping Ruan; Lei Tang; Jiang-Shan Tang; Ming-Yuan Chen; Han Zhang; Ke-Yu Xia; Min Xiao; Yan-Qing Lu

doi:10.3788/COL202321.082701

Chinese Optics Letters, Volume. 21, Issue 8, 082701(2023)

Surpassing the standard quantum limit of optical imaging via deep learning

Miao Cai¹, Zhi-Xiang Li¹, Hao-Dong Wu¹, Ya-Ping Ruan¹, Lei Tang¹, Jiang-Shan Tang¹, Ming-Yuan Chen¹, Han Zhang^1,2, Ke-Yu Xia^1,4,5、*, Min Xiao^1,2,3, and Yan-Qing Lu¹

Author Affiliations

¹College of Engineering and Applied Sciences, National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210023, China

²School of Physics, Nanjing University, Nanjing 210023, China

³Department of Physics, University of Arkansas, Fayetteville, Arkansas 72701, USA

⁴Hefei National Laboratory, Hefei 230088, China

⁵Jiangsu Key Laboratory of Artificial Functional Materials, Nanjing University, Nanjing 210023, China

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Miao Cai, Zhi-Xiang Li, Hao-Dong Wu, Ya-Ping Ruan, Lei Tang, Jiang-Shan Tang, Ming-Yuan Chen, Han Zhang, Ke-Yu Xia, Min Xiao, Yan-Qing Lu, "Surpassing the standard quantum limit of optical imaging via deep learning," Chin. Opt. Lett. 21, 082701 (2023)

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Paper Information

Category: Quantum Optics and Quantum Information

Received: Mar. 6, 2023

Accepted: Apr. 23, 2023

Posted: Apr. 24, 2023

Published Online: Aug. 11, 2023

The Author Email: Ke-Yu Xia (keyu.xia@nju.edu.cn)

DOI:10.3788/COL202321.082701

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology