Opto-Electronic Engineering, Volume. 43, Issue 11, 26(2016)

3D Measurement Based on Structured Light Using a Combination of Gray Code and Line-shift Patterns

SHI Aijun*, BAI Ruilin, and TIAN Qinghua
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    CLP Journals

    [1] Tian Qinghua, Bai Ruilin, Li Du. Point Cloud Segmentation of Scattered Workpieces Based on Improved Euclidean Clustering[J]. Laser & Optoelectronics Progress, 2017, 54(12): 121503

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    SHI Aijun, BAI Ruilin, TIAN Qinghua. 3D Measurement Based on Structured Light Using a Combination of Gray Code and Line-shift Patterns[J]. Opto-Electronic Engineering, 2016, 43(11): 26

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    Paper Information

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    Received: May. 12, 2016

    Accepted: --

    Published Online: Dec. 9, 2016

    The Author Email: Aijun SHI (sajwuxi@163.com)

    DOI:10.3969/j.issn.1003-501x.2016.11.005

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