Opto-Electronic Engineering, Volume. 43, Issue 11, 26(2016)
3D Measurement Based on Structured Light Using a Combination of Gray Code and Line-shift Patterns
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SHI Aijun, BAI Ruilin, TIAN Qinghua. 3D Measurement Based on Structured Light Using a Combination of Gray Code and Line-shift Patterns[J]. Opto-Electronic Engineering, 2016, 43(11): 26
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Received: May. 12, 2016
Accepted: --
Published Online: Dec. 9, 2016
The Author Email: Aijun SHI (sajwuxi@163.com)