Thermo-Optical Aberration Measurement of Thin-Disk Laser Crystal Based on Spatial Carrier Interferometry

Yuanhao Zhang; Guangzhi Zhu; Jiapeng Gao; Mu Wang; Yongqian Chen; Tian Tan; Cheng Peng; Xiao Zhu

doi:10.3788/CJL201946.0404010

Chinese Journal of Lasers, Volume. 46, Issue 4, 0404010(2019)

Thermo-Optical Aberration Measurement of Thin-Disk Laser Crystal Based on Spatial Carrier Interferometry

Yuanhao Zhang^*, Guangzhi Zhu, Jiapeng Gao, Mu Wang, Yongqian Chen, Tian Tan, Cheng Peng, and Xiao Zhu

Author Affiliations

School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, Hubei 430074, China

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Yuanhao Zhang, Guangzhi Zhu, Jiapeng Gao, Mu Wang, Yongqian Chen, Tian Tan, Cheng Peng, Xiao Zhu. Thermo-Optical Aberration Measurement of Thin-Disk Laser Crystal Based on Spatial Carrier Interferometry[J]. Chinese Journal of Lasers, 2019, 46(4): 0404010

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Paper Information

Category: measurement and metrology

Received: Dec. 12, 2018

Accepted: Jan. 18, 2019

Published Online: May. 9, 2019

The Author Email:

DOI:10.3788/CJL201946.0404010

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology