Opto-Electronic Engineering, Volume. 34, Issue 5, 48(2007)

Frequency bathochromic shift used for testing the thermal resistors of laser diodes

[in Chinese]1, [in Chinese]1, and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(3)

    [4] [4] Bellcore issue 1-1998,Generic Requirments GR-468-CORE[S].

    [5] [5] Feng Shiwei,Xie Xuesong,Liu Wei,et al.The Analysis of Thermal Characteristics of the Laser Diode by Transient Thermal Response Method[A].Solid-State and Integrated Circuit Technology,1998 5th International Conference on IEEE[C].[sl]:IEEE,1998.649-652.

    [6] [6] Feng Shiwei,Xie Xuesong,Lu Changzhi,et al.The Thermal Characterization of Packaged Semiconductor Device[A].Sixeenth IEEE SEMI-THERMTM Symposium[C].[sl]:IEEE,2000.220-226.

    CLP Journals

    [1] Yang Yang, Yu Guolei, Li Peixu, Xia Wei, Xu Xiangang. Measurement and Analysis of Junction Temperature of Semiconductor Laser Devices[J]. Laser & Optoelectronics Progress, 2016, 53(1): 11404

    [2] Zhang Zhijun, Liu Yun, Fu Xihong, Shan Xiaonan, Zhu Hongbo, Wang Lijun. Analysis on Overall Thermal Resistance of Laser Diode Beam Combined Modules[J]. Chinese Journal of Lasers, 2012, 39(4): 402010

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    [in Chinese], [in Chinese], [in Chinese]. Frequency bathochromic shift used for testing the thermal resistors of laser diodes[J]. Opto-Electronic Engineering, 2007, 34(5): 48

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    Paper Information

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    Received: Jul. 20, 2006

    Accepted: --

    Published Online: Nov. 14, 2007

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