Opto-Electronic Engineering, Volume. 34, Issue 5, 48(2007)
Frequency bathochromic shift used for testing the thermal resistors of laser diodes
[4] [4] Bellcore issue 1-1998,Generic Requirments GR-468-CORE[S].
[5] [5] Feng Shiwei,Xie Xuesong,Liu Wei,et al.The Analysis of Thermal Characteristics of the Laser Diode by Transient Thermal Response Method[A].Solid-State and Integrated Circuit Technology,1998 5th International Conference on IEEE[C].[sl]:IEEE,1998.649-652.
[6] [6] Feng Shiwei,Xie Xuesong,Lu Changzhi,et al.The Thermal Characterization of Packaged Semiconductor Device[A].Sixeenth IEEE SEMI-THERMTM Symposium[C].[sl]:IEEE,2000.220-226.
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese]. Frequency bathochromic shift used for testing the thermal resistors of laser diodes[J]. Opto-Electronic Engineering, 2007, 34(5): 48