Laser & Optoelectronics Progress, Volume. 58, Issue 14, 1410009(2021)

Light Guide Plate Defect Detection Combing Light Weight and Cascade Deep Learning Network

Junfeng Li1、*, Yansen He1, and Wenzhan Dai2
Author Affiliations
  • 1School of Mechanical Engineering and Automation, Zhejiang Sci-Tech University, Hangzhou, Zhejiang 310018, China
  • 2School of Information and Electronic Engineering, Zhejiang Gongshang University, Hangzhou, Zhejiang 310018, China
  • show less
    References(26)

    [1] Liao H C, Lim Z Y, Hu Y X et al. Guidelines of automated optical inspection (AOI) system development[C]. //2018 IEEE 3rd International Conference on Signal and Image Processing (ICSIP), July 13-15, 2018, Shenzhen, China., 362-366(2018).

    [5] Zhang Y Z, Lu X L. Surface defect detection method of light-guide plate based on improved coherence enhancing diffusion and texture energy measure-Gaussian mixture model[J]. Journal of Computer Applications, 40, 1545-1552(2020).

    [10] Zhou J, Jing J F, Zhang H H et al. Real-time fabric defect detection algorithm based on S-YOLOV3 model[J]. Laser & Optoelectronics Progress, 57, 161001(2020).

    [15] Chen J W, Liu Z G, Wang H R et al. Automatic defect detection of fasteners on the catenary support device using deep convolutional neural network[J]. IEEE Transactions on Instrumentation and Measurement, 67, 257-269(2018).

    [17] Nagata F, Tokuno K, Nakashima K et al. Fusion method of convolutional neural network and support vector machine for high accuracy anomaly detection[C]. //2019 IEEE International Conference on Mechatronics and Automation (ICMA), August 4-7, 2019, Tianjin, China., 970-975(2019).

    [22] Szegedy C, Liu W, Jia Y Q et al. Going deeper with convolutions[C]. //2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), June 7-12, 2015, Boston, MA, USA., 1-9(2015).

    [23] He K M, Zhang X Y, Ren S Q et al. Deep residual learning for image recognition[C]. //2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), June 27-30, 2016, Las Vegas, NV, USA., 770-778(2016).

    [25] Sandler M, Howard A, Zhu M L et al. MobileNetV2: inverted residuals and linear bottlenecks[C]. //2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, June 18-23, 2018, Salt Lake City, UT, USA, 4510-4520(2018).

    [26] Pan S J, Yang Q. A survey on transfer learning[J]. IEEE Transactions on Knowledge and Data Engineering, 22, 1345-1359(2010).

    Tools

    Get Citation

    Copy Citation Text

    Junfeng Li, Yansen He, Wenzhan Dai. Light Guide Plate Defect Detection Combing Light Weight and Cascade Deep Learning Network[J]. Laser & Optoelectronics Progress, 2021, 58(14): 1410009

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Image Processing

    Received: Sep. 28, 2020

    Accepted: Nov. 14, 2020

    Published Online: Jun. 30, 2021

    The Author Email: Junfeng Li (ljf2003@zstu.edu.cn)

    DOI:10.3788/LOP202158.1410009

    Topics