Infrared and Laser Engineering, Volume. 52, Issue 10, 20230063(2023)

Method for characterizing frequency of frequency-stabilized semiconductor lasers

Shanshan Li1, Jiewei Yang1, Tianxin Yang1, Zhaoying Wang1, and Hengkang Zhang2
Author Affiliations
  • 1Key Laboratory of the Ministry of Education on Optoelectronic Information Technology, School of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China
  • 2Beijing Institute of Control Engineering, Beijing 100190, China
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    Figures & Tables(5)
    Experimental setup for optical frequency drift measurement based on delay self-heterodyne interferometer
    The experiment result for optical frequency drift of the frequency stabilized DFB-LD within10 ms based on delay self-heterodyne interferometer. (a) The first group (14.04- −3.33 MHz, 17.37 MHz); (b) The second group (18.24- −6.28 MHz, 24.52 MHz); (c) the third group (3.24- −17.17 MHz, 20.41 MHz)
    Experimental setup for frequency drift measurement of frequency stabilized laser based on fiber femtosecond optical frequency comb
    Experimental result of beat signal between DFB-LD with femtosecond optical frequency comb system
    The experiment result for optical frequency drift of the frequency stabilized DFB-LD within 50 minutes based on the femtosecond optical frequency comb system
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    Shanshan Li, Jiewei Yang, Tianxin Yang, Zhaoying Wang, Hengkang Zhang. Method for characterizing frequency of frequency-stabilized semiconductor lasers[J]. Infrared and Laser Engineering, 2023, 52(10): 20230063

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    Paper Information

    Category: Lasers & Laser optics

    Received: Feb. 13, 2023

    Accepted: --

    Published Online: Nov. 21, 2023

    The Author Email:

    DOI:10.3788/IRLA20230063

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