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Laser & Optoelectronics Progress, Volume. 55, Issue 5, 051602(2018)

Controllable Modulation of Surface Plasmon Resonance Wavelength of ITO Thin Films

Xinyang Cai1、1; , Xinwei Wang、2*; *; , Ruxue Li1、1; , Dengkui Wang1、1; , Xuan Fang1、1; , Dan Fang1、1; , Yuping Zhang1、3; , Xiuping Sun1、1; , Xiaohua Wang1、1; , and Zhipeng Wei1、1;
Author Affiliations
  • 1 State Key Laboratory of High Power Semiconductor Laser, Changchun University of Science and Technology, Changchun, Jilin 130022, China
  • 1 State Key Laboratory of Supramolecular Structure and Material, Institute of Theoretical Chemistry,Jilin University, Changchun, Jilin 130022, China
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    Dielectric permittivity of ITO films with different thicknesses. (a) Real part; (b) imaginary part

    Fig. 1. Dielectric permittivity of ITO films with different thicknesses. (a) Real part; (b) imaginary part

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    XRD patterns of ITO films

    Fig. 2. XRD patterns of ITO films

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    Carrier concentration and resistivity of ITO films versus film thickness

    Fig. 3. Carrier concentration and resistivity of ITO films versus film thickness

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    ε'1, ε″1 and carrier concentration of ITO films with different thicknesses

    Fig. 4. ε'1, ε″1 and carrier concentration of ITO films with different thicknesses

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    Xinyang Cai, Xinwei Wang, Ruxue Li, Dengkui Wang, Xuan Fang, Dan Fang, Yuping Zhang, Xiuping Sun, Xiaohua Wang, Zhipeng Wei. Controllable Modulation of Surface Plasmon Resonance Wavelength of ITO Thin Films[J]. Laser & Optoelectronics Progress, 2018, 55(5): 051602

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    Paper Information

    Category: Materials

    Received: Jan. 12, 2018

    Accepted: --

    Published Online: Sep. 11, 2018

    The Author Email: Xinwei Wang ( wxw4122@cust.edu.cn)

    DOI:10.3788/LOP55.051602

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology