Laser & Optoelectronics Progress, Volume. 53, Issue 6, 61202(2016)
Numerical Simulation of Micro-Stress Measured by Heterodyne Interference Technology Based on Total Reflection
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Gao Kai. Numerical Simulation of Micro-Stress Measured by Heterodyne Interference Technology Based on Total Reflection[J]. Laser & Optoelectronics Progress, 2016, 53(6): 61202
Paper Information
Category: Instrumentation, Measurement and Metrology
Received: Nov. 26, 2015
Accepted: --
Published Online: Jun. 6, 2016
The Author Email: Gao Kai (gk2217772@126.com)
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