Photon-counting polarimetric imaging provides more dimensional information compared to conventional imaging systems. We present a compact dual-wavelength infrared polarimetric light detection and ranging system operating at 1550 nm and 2004 nm, utilizing direct detection with superconducting nanowire single-photon detectors. This system achieves millimeter-scale resolution in both lateral and axial dimensions at a target distance of ~1.3 m. Experimental results demonstrate improved material discrimination advantage at low photon flux by integrating dual-band photon counting detection with polarimetric imaging, outperforming traditional intensity-based measurement methods. This work demonstrates broad application prospects in scenarios involving mid-infrared remote sensing and complex environmental exploration.