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Journal of Inorganic Materials, Volume. 35, Issue 8, 889(2020)

Molecular Dynamics Analysis of Chemical Disorders Induced by Irradiated Point Defects in 6H-SiC

Xiuyu ZHANG1... Xiaofei CHEN2, Hao WANG1, Xun GUO1 and Jianming XUE1,* |Show fewer author(s)
Author Affiliations
  • 1State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871, China
  • 2China Institute of Nuclear Information and Economics, Beijing 100048, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (6)
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    Figures & Tables(6)
    Cubic cell modeling and relaxation of 6H-SiC crystal structure
    1. Cubic cell modeling and relaxation of 6H-SiC crystal structure

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    Evolution of Frenkel pairs of PKA with different energies and different types during the process of linear cascade collision to relaxation recovery
    2. Evolution of Frenkel pairs of PKA with different energies and different types during the process of linear cascade collision to relaxation recovery

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    Evolution of six main point defects with the number of PKA
    3. Evolution of six main point defects with the number of PKA

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    Statistics on the number of C-C bonds after multi- sub-collision cascade
    4. Statistics on the number of C-C bonds after multi- sub-collision cascade

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    Statistics on the number of Si-Si bonds after multi- sub-collision cascade
    5. Statistics on the number of Si-Si bonds after multi- sub-collision cascade

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    The statistical final yield of six main point defects after multi-sub-collision cascade
    6. The statistical final yield of six main point defects after multi-sub-collision cascade

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    Xiuyu ZHANG, Xiaofei CHEN, Hao WANG, Xun GUO, Jianming XUE. Molecular Dynamics Analysis of Chemical Disorders Induced by Irradiated Point Defects in 6H-SiC[J]. Journal of Inorganic Materials, 2020, 35(8): 889

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    Paper Information

    Category: RESEARCH PAPER

    Received: Sep. 10, 2019

    Accepted: --

    Published Online: Mar. 15, 2021

    The Author Email: XUE Jianming (jmxue@pku.edu.cn)

    DOI:10.15541/jim20190472

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology