Acta Photonica Sinica, Volume. 40, Issue 11, 1657(2011)
Raman Spectroscopic Study of the Crystallization of Intrinsic Amorphous Silicon Thin Films with a 488 nm Continuouswave Laser
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DUAN Guoping, CHEN Junling, HAN Junhe, HUANG Mingju. Raman Spectroscopic Study of the Crystallization of Intrinsic Amorphous Silicon Thin Films with a 488 nm Continuouswave Laser[J]. Acta Photonica Sinica, 2011, 40(11): 1657
Received: Jul. 11, 2011
Accepted: --
Published Online: Dec. 12, 2011
The Author Email: Guoping DUAN (dgp2009@163.com)