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Acta Photonica Sinica, Volume. 40, Issue 11, 1657(2011)

Raman Spectroscopic Study of the Crystallization of Intrinsic Amorphous Silicon Thin Films with a 488 nm Continuouswave Laser

DUAN Guoping1...2,*, CHEN Junling1,2, HAN Junhe1,2, and HUANG Mingju12 |Show fewer author(s)
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    DUAN Guoping, CHEN Junling, HAN Junhe, HUANG Mingju. Raman Spectroscopic Study of the Crystallization of Intrinsic Amorphous Silicon Thin Films with a 488 nm Continuouswave Laser[J]. Acta Photonica Sinica, 2011, 40(11): 1657

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    Paper Information

    Received: Jul. 11, 2011

    Accepted: --

    Published Online: Dec. 12, 2011

    The Author Email: Guoping DUAN (dgp2009@163.com)

    DOI:10.3788/gzxb20114011.1657

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology