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Laser & Optoelectronics Progress, Volume. 53, Issue 1, 11404(2016)

Measurement and Analysis of Junction Temperature of Semiconductor Laser Devices

Yang Yang1,2、*, Yu Guolei1,2, Li Peixu2, Xia Wei2, and Xu Xiangang1,2
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    Yang Yang, Yu Guolei, Li Peixu, Xia Wei, Xu Xiangang. Measurement and Analysis of Junction Temperature of Semiconductor Laser Devices[J]. Laser & Optoelectronics Progress, 2016, 53(1): 11404

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    Paper Information

    Category: Lasers and Laser Optics

    Received: Aug. 3, 2015

    Accepted: --

    Published Online: Dec. 25, 2015

    The Author Email: Yang Yang (yangyang.zju@163.com)

    DOI:10.3788/lop53.011404

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology