Detection of subsurface defects of fused silica optics by confocal scattering microscopy

Bin Ma; Zhengxiang Shen; Pengfei He; Yiqin Ji; Tian Sang; Huasong Liu; Dandan Liu; Zhanshan Wang

doi:10.3788/COL20100803.0296

Chinese Optics Letters, Volume. 8, Issue 3, 296(2010)

Detection of subsurface defects of fused silica optics by confocal scattering microscopy

Bin Ma^1,2,3, Zhengxiang Shen^1,3, Pengfei He², Yiqin Ji³, Tian Sang^1,4, Huasong Liu^1,3, Dandan Liu³, and Zhanshan Wang^1,3

Author Affiliations

¹Institute of Precision Optical Engineering, Tongji University, Shanghai 200092, China

²School of Aerospace Engineering and Applied Mechanics, Tongji University, Shanghai 200092, China

³Tianjin Key Laboratory of Optical Thin Films, Tianjin Jinhang Institute of Technical Physics, Tianjin 300192, China

⁴Department of Physics, Qiannan Normal College for Nationalities, Duyun 558000, China

show less

Cited By

Article index updated:Mar. 12, 2024

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.

The article is cited by 11 article(s) from Web of Science.

Tools

Get Citation

Copy Citation Text

Bin Ma, Zhengxiang Shen, Pengfei He, Yiqin Ji, Tian Sang, Huasong Liu, Dandan Liu, Zhanshan Wang. Detection of subsurface defects of fused silica optics by confocal scattering microscopy[J]. Chinese Optics Letters, 2010, 8(3): 296

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Received: Jun. 1, 2009

Accepted: --

Published Online: Mar. 11, 2010

The Author Email:

DOI:10.3788/COL20100803.0296

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology