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Semiconductor Optoelectronics, Volume. 44, Issue 2, 199(2023)

Study of A General Testing Scheme of the CCD’s Charge to Voltage Factor

TANG Zunlie, LI Bole, ZHOU Jianyong*, TU Ge, JIANG Yuqi, and LI Xiaoli
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    [1] [1] Janesick J R, Elliott T, Collins S, et al. Scientific charge-coupled devices[J]. Optical Engineering, 2001, 26(8): 692-714.

    [4] [4] Kameshima T, Ono S, Kudo T, et al. Development of an X-ray pixel detector with multi-port charge-coupled device for X-ray free-electron laser experiments[J]. Rev. of Scientific Instruments, 2014, 85(3): 033110.

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    TANG Zunlie, LI Bole, ZHOU Jianyong, TU Ge, JIANG Yuqi, LI Xiaoli. Study of A General Testing Scheme of the CCD’s Charge to Voltage Factor[J]. Semiconductor Optoelectronics, 2023, 44(2): 199

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    Received: Nov. 11, 2022

    Accepted: --

    Published Online: Aug. 14, 2023

    The Author Email: Jianyong ZHOU (18996013020@189.cn)

    DOI:10.16818/j.issn1001-5868.2022111101

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology