Semiconductor Optoelectronics, Volume. 44, Issue 2, 199(2023)
Study of A General Testing Scheme of the CCD’s Charge to Voltage Factor
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TANG Zunlie, LI Bole, ZHOU Jianyong, TU Ge, JIANG Yuqi, LI Xiaoli. Study of A General Testing Scheme of the CCD’s Charge to Voltage Factor[J]. Semiconductor Optoelectronics, 2023, 44(2): 199
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Received: Nov. 11, 2022
Accepted: --
Published Online: Aug. 14, 2023
The Author Email: Jianyong ZHOU (18996013020@189.cn)