Semiconductor Optoelectronics, Volume. 44, Issue 2, 199(2023)

Study of A General Testing Scheme of the CCD’s Charge to Voltage Factor

TANG Zunlie, LI Bole, ZHOU Jianyong*, TU Ge, JIANG Yuqi, and LI Xiaoli
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    A general efficient charge to voltage factor (CVF) testing scheme is proposed by analysing the working principle of the photovoltaic conversion, charge transfer and charge output in CCD. In the scheme, the photosensitive zone of CCD transfered charge to the horizontal zone and the horizontal zone continuously output charge packets with a constant frequency by adding a DC bias on the photosensitive area of CCD and the continuously transfer driving sequential was added on the horizontal zone. Thus, the stable intensity response signal was output. Then, CVF was calculated by relationship between the reset leakage current and output signal intensity. According to the principle of the method, a general testing device for different CCD devices was designed to adapt to various CCDs, and a variety of CCDs were used for testing and verification. The result shows that the proposed scheme inproves the testing efficiency, accuracy and stability of the CVF.

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    TANG Zunlie, LI Bole, ZHOU Jianyong, TU Ge, JIANG Yuqi, LI Xiaoli. Study of A General Testing Scheme of the CCD’s Charge to Voltage Factor[J]. Semiconductor Optoelectronics, 2023, 44(2): 199

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    Paper Information

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    Received: Nov. 11, 2022

    Accepted: --

    Published Online: Aug. 14, 2023

    The Author Email: Jianyong ZHOU (18996013020@189.cn)

    DOI:10.16818/j.issn1001-5868.2022111101

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