Infrared and Laser Engineering, Volume. 51, Issue 2, 20210880(2022)

System error calibration for Φ300 mm vertical Fizeau interferometer based on liquid reference

Zhiyao Ma, Lei Chen, Donghui Zheng*, Haiying Ma, Ruokun Li, Chen Huang, and Chenhui Hu
Author Affiliations
  • School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
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    In high-precision interference detection, the calibration of interferometer system errors was important. According to the structural characteristics of the vertical Fizeau interferometer, the liquid reference plane was used as a reference to compensate and calibrate the self-weight deformation and clamping deformation of the reference flat crystal, and calibrate its system error. Theoretically, the curvature of the liquid surface and the radius of the earth were the same, which can be regarded as a plane reference to calibrate the system error of the vertical structure interferometer. For the Φ300 mm vertical Fizeau interferometer, the influence of different liquid viscosity, thickness, interference cavity length and temperature was studied, and a reliable liquid reference plane reference was constructed. Through the liquid reference plane, the interferometer was guided to refer to the installation and calibration of the reference flat crystal, and its system error was compensated. The accuracy of the interferometery reached 0.035λ, which was better than λ/25. In order to further verify the reliability and accuracy of the liquid reference plane, repeatability experiments were carried out, and the liquid reference plane of Φ400 mm and Φ450 mm were used for comparison test. The deviation of the two calibration results was better than λ/100 (6 nm). The reliability and accuracy of the liquid reference plane were verified.

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    Zhiyao Ma, Lei Chen, Donghui Zheng, Haiying Ma, Ruokun Li, Chen Huang, Chenhui Hu. System error calibration for Φ300 mm vertical Fizeau interferometer based on liquid reference[J]. Infrared and Laser Engineering, 2022, 51(2): 20210880

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    Paper Information

    Category: Special issue-Precision optical metrological testing

    Received: Nov. 24, 2021

    Accepted: Jan. 26, 2022

    Published Online: Mar. 21, 2022

    The Author Email: Zheng Donghui (zdonghui@njust.edu.cn)

    DOI:10.3788/IRLA20210880

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