Acta Photonica Sinica, Volume. 50, Issue 5, 151(2021)
Investigation for Relationship between Sidewall Roughness of Silicon-on-insulator Waveguide and Loss of Guided-mode
Figures & Tables(3)
Fig. 5. Numerical simulations for the OPL coefficient α3D vs SWR of SOI waveguide for TE- and TM-mode
Fig. 6. Propagation losses test of three SOI waveguides and the responses of F-P cavity formed by the waveguide channel to temperature change
Tools
Get Citation
Copy Citation Text
Bin WANG, Degui SUN, Hongpeng SHANG. Investigation for Relationship between Sidewall Roughness of Silicon-on-insulator Waveguide and Loss of Guided-mode[J]. Acta Photonica Sinica, 2021, 50(5): 151
Paper Information
Category: Fiber Optics and Optical Communications
Received: Nov. 11, 2020
Accepted: Mar. 1, 2021
Published Online: Jun. 22, 2021
The Author Email: SUN Degui (sundg@cust.edu.cn)
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20