Infrared Technology, Volume. 46, Issue 4, 475(2024)
Improved K-means Clustering-based Defect Detection Method for Photovoltaic Panels
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ZHAO Qiang, LIU Shengjie, HAN Dongcheng, LIU Changyu, YANG Shizhi. Improved K-means Clustering-based Defect Detection Method for Photovoltaic Panels[J]. Infrared Technology, 2024, 46(4): 475
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Received: Sep. 17, 2022
Accepted: --
Published Online: Sep. 2, 2024
The Author Email: Qiang ZHAO (rommel99@163.com)
CSTR:32186.14.