Infrared Technology, Volume. 46, Issue 4, 475(2024)

Improved K-means Clustering-based Defect Detection Method for Photovoltaic Panels

Qiang ZHAO1...2,*, Shengjie LIU1,2, Dongcheng HAN2,3,4, Changyu LIU1,2 and Shizhi YANG4 |Show fewer author(s)
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    ZHAO Qiang, LIU Shengjie, HAN Dongcheng, LIU Changyu, YANG Shizhi. Improved K-means Clustering-based Defect Detection Method for Photovoltaic Panels[J]. Infrared Technology, 2024, 46(4): 475

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    Paper Information

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    Received: Sep. 17, 2022

    Accepted: --

    Published Online: Sep. 2, 2024

    The Author Email: Qiang ZHAO (rommel99@163.com)

    DOI:

    CSTR:32186.14.

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