Electronics Optics & Control, Volume. 20, Issue 3, 53(2013)

Summarization of Testing Systems for Low-Background Infrared Cryogenic Chamber

SHI Xuehu... WU Xiaoyang and WANG Yingrui |Show fewer author(s)
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    SHI Xuehu, WU Xiaoyang, WANG Yingrui. Summarization of Testing Systems for Low-Background Infrared Cryogenic Chamber[J]. Electronics Optics & Control, 2013, 20(3): 53

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    Paper Information

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    Received: Feb. 2, 2012

    Accepted: --

    Published Online: Mar. 27, 2013

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2013.03.012

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