Electronics Optics & Control, Volume. 20, Issue 3, 53(2013)
Summarization of Testing Systems for Low-Background Infrared Cryogenic Chamber
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SHI Xuehu, WU Xiaoyang, WANG Yingrui. Summarization of Testing Systems for Low-Background Infrared Cryogenic Chamber[J]. Electronics Optics & Control, 2013, 20(3): 53
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Received: Feb. 2, 2012
Accepted: --
Published Online: Mar. 27, 2013
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