Acta Photonica Sinica, Volume. 52, Issue 6, 0631001(2023)

Study on Thickness Uniformity of Double-sided Sputtering Film on Large-diameter Ultra-thin Substrates

Xiuhua FU1,2, Junqi LIU1、*, Zhuolin LI3, Haicheng LIU1, Haifeng REN4, Yibo WANG1, and Kexu HAN1
Author Affiliations
  • 1College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
  • 2Zhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528436, China
  • 3Moral Education and Comprehensive Teaching and Research Training Department, Jilin Provincial Institute of Education, Changchun 130022, China
  • 4Guang Chi Technology (Shanghai) Co., Ltd., Shanghai 200444, China
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    References(15)

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    [12] PAN Lei, WANG Xiaoqiang, ZHANG Zhong et al. Preparation of Mo/Si multilayer film with high uniformity diameter of 120mm by magnetron sputtering[J]. High Power Laser and Particle Beam, 22, 1535-1538(2010).

    [13] ZHANG Z, QI R, YAO Y et al. Improving thickness uniformity of Mo/Si multilayers on curved spherical substrates by a masking technique[J]. Coatings, 9, 851(2019).

    [14] WEI Boyang, LIU Dongmei, FU Xiuhua et al. Study on film thickness uniformity of magnetron sputtering system based on twin target[J]. Acta Optica Sinica, 41, 0731001(2021).

    [15] YU He, WANG Tao, WU Zhiming et al. Study on film deposition uniformity of male-rotation magnetron sputtering coating system[J]. Journal of Vacuum Science and Technology, 30, 149-153(2010).

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    Xiuhua FU, Junqi LIU, Zhuolin LI, Haicheng LIU, Haifeng REN, Yibo WANG, Kexu HAN. Study on Thickness Uniformity of Double-sided Sputtering Film on Large-diameter Ultra-thin Substrates[J]. Acta Photonica Sinica, 2023, 52(6): 0631001

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    Paper Information

    Category:

    Received: Nov. 24, 2022

    Accepted: Jan. 19, 2023

    Published Online: Jul. 27, 2023

    The Author Email: Junqi LIU (ljqcust@163.com)

    DOI:10.3788/gzxb20235206.0631001

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