Laser & Optoelectronics Progress, Volume. 56, Issue 14, 142401(2019)

Identification of Metals and Dielectrics Based on Mueller Matrix

Zhengang Yan1, Weiping Sun1, Jie Li1, Jiangpeng Wu1, Xinhong Zhu1, Mengdi Yuan1, Liang Xue2, and Keding Yan3、*
Author Affiliations
  • 1 Xi'an Modern Control Technology Institute, Xi'an, Shaanxi 710065, China
  • 2 College of Electronic and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China
  • 3 School of Electronic Information Engineering, Xi'an Technological University, Xi'an, Shaanxi 710021, China
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    References(12)

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    [6] Bennett H E, Koehler W F. Precision measurement of absolute specular reflectance with minimized systematic errors[J]. Journal of the Optical Society of America, 50, 1-6(1960).

    [7] Porteus J O. Relation between the height distribution of a rough surface and the reflectance at normal incidence[J]. Journal of the Optical Society of America, 53, 1394-1402(1963).

    [10] Yan K D, Wang S Y, Jiang S et al. Full angular Stokes vectors of light scattering from two-dimensional randomly rough surfaces by Kirchhoff approximation method[J]. Journal of Optics, 16, 105714(2014).

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    [13] He Z C. Modeling and calculation of electromagnetic scattering of vegetation on rough terrain[D]. Chengdu: University of Electronic Science and Technology of China(2018).

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    Zhengang Yan, Weiping Sun, Jie Li, Jiangpeng Wu, Xinhong Zhu, Mengdi Yuan, Liang Xue, Keding Yan. Identification of Metals and Dielectrics Based on Mueller Matrix[J]. Laser & Optoelectronics Progress, 2019, 56(14): 142401

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    Paper Information

    Category: Optics at Surfaces

    Received: Oct. 29, 2018

    Accepted: Feb. 20, 2019

    Published Online: Jul. 12, 2019

    The Author Email: Yan Keding (yankeding168@163.com)

    DOI:10.3788/LOP56.142401

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