Laser & Optoelectronics Progress, Volume. 56, Issue 14, 142401(2019)
Identification of Metals and Dielectrics Based on Mueller Matrix
Fig. 1. Models of two-dimensional random rough surfaces. (a) δ=0.4 μm, T=6 μm; (b) δ=0.2 μm, T=6 μm
Fig. 2. Two-dimensional scattering model
Fig. 3. Full angle distribution of Mueller matrix of silver surface when δ=0.2λ and T=6λ
Fig. 4. Full angle distribution of Mueller matrix of silver surface when δ=0.4λ and T=6λ
Fig. 5. Full angle distribution of Mueller matrix of silver surface when δ=0.6λ and T=6λ
Fig. 6. Full angle distribution of Mueller matrix of dielectric glass surface when δ=0.2λ and T=6λ
Fig. 7. Full angle distribution of Mueller matrix of dielectric glass surface when δ=0.4λ and T=6λ
Fig. 8. Full angle distribution of Mueller matrix of dielectric glass surface when δ=0.6λ and T=6 λ
Get Citation
Copy Citation Text
Zhengang Yan, Weiping Sun, Jie Li, Jiangpeng Wu, Xinhong Zhu, Mengdi Yuan, Liang Xue, Keding Yan. Identification of Metals and Dielectrics Based on Mueller Matrix[J]. Laser & Optoelectronics Progress, 2019, 56(14): 142401
Category: Optics at Surfaces
Received: Oct. 29, 2018
Accepted: Feb. 20, 2019
Published Online: Jul. 12, 2019
The Author Email: Yan Keding (yankeding168@163.com)