Journal of Terahertz Science and Electronic Information Technology , Volume. 22, Issue 1, 62(2024)

Permittivity measurement technology of flat dielectrics using microwave split-cavity method

WANG Yi, ZHANG Cuicui, YU Mingmei, and WANG Jianzhong*
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    References(5)

    [4] [4] HUBER O, FASETH T, MAGERL G, et al. Dielectric characterization of RF-printed circuit board materials by microstrip transmission lines and conductor-backed coplanar waveguides up to 110 GHz[J]. IEEE Transactions on Microwave Theory and Techniques, 2018,66(1):237-244. doi:10.1109/TMTT.2017.2750152.

    [7] [7] SáNCHEZ J R,NOVA V,BACHILLER C,et al. Characterization of nematic liquid crystal at microwave frequencies using splitcylinder resonator method[J]. IEEE Transactions on Microwave Theory and Techniques, 2019, 67(7): 2812-2820. doi: 10.1109/ TMTT.2019.2916790.

    [12] [12] IPC. Stripline test for complex relative permittivity of circuit board materials to 14 GHz[M]// IPC-TM-650 Test Methods Manual. Northbrook,IL:IPC, 1998.

    [13] [13] IPC. Relative permittivity and loss tangent using a split-cylinder resonator[M]// IPC-TM-650 Test Methods Manual. Bannockburn,IL:IPC, 2007.

    [15] [15] FERRO. Technical data sheet:low temperature co-fired ceramic systems A6M-E high frequency LTCC tape system[Z]. Mayfield Heights,OH:Ferro Corporation, 2015.

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    WANG Yi, ZHANG Cuicui, YU Mingmei, WANG Jianzhong. Permittivity measurement technology of flat dielectrics using microwave split-cavity method[J]. Journal of Terahertz Science and Electronic Information Technology , 2024, 22(1): 62

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    Paper Information

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    Received: Nov. 7, 2021

    Accepted: --

    Published Online: Jul. 5, 2024

    The Author Email: WANG Jianzhong (WJLZ1999@sina.com)

    DOI:10.11805/tkyda2021395

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