Journal of Terahertz Science and Electronic Information Technology , Volume. 22, Issue 1, 62(2024)

Permittivity measurement technology of flat dielectrics using microwave split-cavity method

WANG Yi, ZHANG Cuicui, YU Mingmei, and WANG Jianzhong*
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    WANG Yi, ZHANG Cuicui, YU Mingmei, WANG Jianzhong. Permittivity measurement technology of flat dielectrics using microwave split-cavity method[J]. Journal of Terahertz Science and Electronic Information Technology , 2024, 22(1): 62

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    Paper Information

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    Received: Nov. 7, 2021

    Accepted: --

    Published Online: Jul. 5, 2024

    The Author Email: WANG Jianzhong (WJLZ1999@sina.com)

    DOI:10.11805/tkyda2021395

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