Photonics Research, Volume. 2, Issue 2, 51(2014)

False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments

Hui Yan1,2 and and Jingsong Wei1、*
Author Affiliations
  • 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    References(33)

    [5] J. Wei. Nonlinear Performance and Characterization Methods in Optics(2013).

    [10] R. A. Ganeev, A. I. Ryasnyansky. Reflection z-scan measurements of opaque semiconductor thin films. Phys. Status Solidi A, 202, 120-125(2005).

    [22] B. Zhou, Y. Gao, C. Chen, J. Chen. The Principle of Laser(2009).

    [26] C. Liu, J. Ge, J. Chen. Investigation of loss and threshold characteristics in the laser diode with external feedback. Chin. J. Lasers, 31, 1413-1416(2004).

    [28] C. Liu, J. Ge, J. Chen. Influence of external cavity feedback on the oscillating characteristics of a semiconductor laser. Acta Phys. Sin., 55, 5211-5215(2006).

    [29] B. Cai, Z. Liu, X. Liu. The structure, theory and characteristics of semiconductor lasers. Semiconductor Lasers, 40-42(1995).

    [30] A. E. Siegmann. Lasers(1986).

    CLP Journals

    [1] Xinghao Zhang, Jingsong Wei, "Direct detection of the transient superresolution effect of nonlinear saturation absorption thin films," Photonics Res. 3, 100 (2015)

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    Hui Yan, and Jingsong Wei, "False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments," Photonics Res. 2, 51 (2014)

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    Paper Information

    Category: Nonlinear Optics

    Received: Dec. 3, 2013

    Accepted: Jan. 23, 2014

    Published Online: Nov. 5, 2014

    The Author Email: and Jingsong Wei (weijingsong@siom.ac.cn)

    DOI:10.1364/PRJ.2.000051

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