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Photonics Research, Volume. 2, Issue 2, 51(2014)

False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments

Hui Yan1,2 and and Jingsong Wei1、*
Author Affiliations
  • 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    Hui Yan, and Jingsong Wei. False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments[J]. Photonics Research, 2014, 2(2): 51

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    Paper Information

    Category: Nonlinear Optics

    Received: Dec. 3, 2013

    Accepted: Jan. 23, 2014

    Published Online: Nov. 5, 2014

    The Author Email: and Jingsong Wei (weijingsong@siom.ac.cn)

    DOI:10.1364/PRJ.2.000051

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology