Journal of Applied Optics, Volume. 45, Issue 3, 568(2024)

Influence of laser energy density on thermal stress at photosensitive layer of CMOS detector

Jinqi DAI1... Hailong YU1, Junguang WANG2 and Xun GAO1,* |Show fewer author(s)
Author Affiliations
  • 1School of Physics, Changchun University of Science and Technology, Changchun 130022, China
  • 2Optoelectronics Research Institute of China Electronics Technology Group Corporation, Tianjin 300308, China
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    References(12)

    [1] Ang WANG, Feng GUO, Zhiwu ZHU et al. Comparative study of hard CMOS damage irradiated by CW laser and single-pulse ns laser. High Power Laser and Particle Beams, 26, 49-53(2014).

    [2] Ming SHAO, Le ZHANG, Leilei ZHANG et al. Comparative study on saturation effect of 1.06 μm laser jamming CCD and CMOS cameras. Journal of Applied Optics, 35, 163-167(2014).

    [3] Run GAO, Chunhui NIU, Xiaoying LI. Experiment and mechanism analysis of 632 nm laser jamming CCD and CMOS. Laser Journal, 37, 5-9(2016).

    [4] Mengzhen ZHU, Yun LIU, Chaowei MI et al. Experimental study on a CMOS image sensor damaged by a composite laser. Infrared and Laser Engineering, 51, 3788(2022).

    [6] Qiaoyun ZHANG, Qingshan CHEN, Chunhui NIU. Jamming mechanism analysis of laser thermal effect on CMOS detector. Laser Journal, 39, 72-76(2018).

    [7] Tao ZHANG, Xinyang LI, Jianfeng LI et al. sCMOS real-time nonuniformity correction based on adaptive multipoint method. Opto-Electronic Engineering, 48, 210036(2021).

    [8] Jiaqi WEN, Jintian BIAN, Xin LI et al. Research progress of laser dazzle and damage CMOS image sensor (invited). Infrared and Laser Engineering, 52, 3788(2023).

    [9] Nan JIANG, Chu ZHANG, Yanxiong NIU et al. Numerical simulation of pulsed laser induced damage on CCD arrays. Laser & Infrared, 38, 1004-1007(2008).

    [10] Juan BI, Xihe ZHANG, Xiaowu NI. Mechanism for long pulse laser-induced hard damage to the MOS pixel of CCD image sensor. Acta Physica Sinica, 60, 340-345(2011).

    [11] Yuejuan HE, Qing PENG, Wei ZHANG. Analysis of the laser-induced circumferential thermal stress fields in hollow metal cylinders by finite element method. Applied Laser, 29, 317-319(2009).

    [12] Z W LI, X WANG, Z H SHEN et al. Mechanisms for the millisecond laser-induced functional damage to silicon charge-coupled imaging sensors. Applied Optics, 54, 378-388(2015).

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    Jinqi DAI, Hailong YU, Junguang WANG, Xun GAO. Influence of laser energy density on thermal stress at photosensitive layer of CMOS detector[J]. Journal of Applied Optics, 2024, 45(3): 568

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    Paper Information

    Category: Research Articles

    Received: Oct. 31, 2023

    Accepted: --

    Published Online: Jun. 2, 2024

    The Author Email: GAO Xun (高勋(1978—))

    DOI:10.5768/JAO202445.0310011

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